Search Results - Świątek, Z.

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    The influence of ion implantation by phosphorous on structural changes in porous silicon by Swiatek, Z., Lytvynchuk, I., Fodchuk, I.

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    Structural and Microstructural Analysis of Zn–Mo Alloy Layers Electrodeposited from Aqueous Citrate Solution by Świątek, Z., Kazimierczak, H., Ozga, P., Bonchyk, O., Savytskyy, H.

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    Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry by Fodchuk, І.М., Dovganyuk, V.V., Litvinchuk, Т.V., Kladko, V.P., Slobodian, М.V., Gudymenko, O.Yo., Swiatek, Z.

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    Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data by Borcha, M.D., Solodkyi, M.S., Balovsyak, S.V., Tkach, V.M., Hutsuliak, I.I., Kuzmin, A.R., Tkach, O.O., Kladko, V.P., Gudymenko, O.Yo., Liubchenko, О.І., Swiatek, Z.

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