The influence of ion implantation by phosphorous on structural changes in porous silicon за авторством Swiatek, Z., Lytvynchuk, I., Fodchuk, I.

Отримати повний текст

Structural and Microstructural Analysis of Zn–Mo Alloy Layers Electrodeposited from Aqueous Citrate Solution за авторством Świątek, Z., Kazimierczak, H., Ozga, P., Bonchyk, O., Savytskyy, H.

Отримати повний текст

Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry за авторством Fodchuk, І.М., Dovganyuk, V.V., Litvinchuk, Т.V., Kladko, V.P., Slobodian, М.V., Gudymenko, O.Yo., Swiatek, Z.

Отримати повний текст

Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data за авторством Borcha, M.D., Solodkyi, M.S., Balovsyak, S.V., Tkach, V.M., Hutsuliak, I.I., Kuzmin, A.R., Tkach, O.O., Kladko, V.P., Gudymenko, O.Yo., Liubchenko, О.І., Swiatek, Z.

Отримати повний текст