Suchergebnisse - Świątek, Z.
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Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry von Fodchuk, І.М., Dovganyuk, V.V., Litvinchuk, Т.V., Kladko, V.P., Slobodian, М.V., Gudymenko, O.Yo., Swiatek, Z.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2010)Volltext
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Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data von Borcha, M.D., Solodkyi, M.S., Balovsyak, S.V., Tkach, V.M., Hutsuliak, I.I., Kuzmin, A.R., Tkach, O.O., Kladko, V.P., Gudymenko, O.Yo., Liubchenko, О.І., Swiatek, Z.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2019)Volltext
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