Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin von R. M. Rudenko, V. V. Voitovych, M. M. Krasko, A. G. Kolosyuk, A. M. Kraichynskyi, V. O. Yukhymchuk, V. A. Makara

Volltext

Formation of nanocrystalline silicon in tin-doped amorphous silicon films von R. M. Rudenko, O. O. Voitsihovska, V. V. Voitovych, M. M. Krasko, A. G. Kolosyuk, Yu. Povarchuk, M. P. Rudenko, L. M. Knorozok

Volltext

Behavior of hydrogen during crystallization of thin silicon films doped with tin von R. M. Rudenko, M. M. Krasko, V. V. Voitovych, A. G. Kolosyuk, Yu. Povarchuk, A. M. Kraichynskyi, V. O. Yukhymchuck, Ya. Bratus, M. V. Voitovych, I. A. Zaloilo

Volltext