Researches of diffusion processes in powder materials and their role in structure formation

за авторством O. P. Haponova, A. H. Kolosiuk
Опубліковано 2014

Influence of divacancy-oxygen defects on recombination properties of n-Si subjected to irradiation and subsequent annealing

за авторством M. M. Krasko, A. H. Kolosiuk, V. V. Voitovych, Yu. Povarchuk, I. S. Rohutskyi
Опубліковано 2018

Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin

за авторством R. M. Rudenko, V. V. Voitovych, M. M. Krasko, A. H. Kolosiuk, A. M. Kraichynskyi, V. O. Yukhymchuk, V. A. Makara
Опубліковано 2013

Formation of nanocrystalline silicon in tin-doped amorphous silicon films

за авторством R. M. Rudenko, O. O. Voitsikhovska, V. V. Voitovych, A. H. Kolosiuk, M. M. Krasko, Yu. Povarchuk, M. P. Rudenko, L. M. Knorozok
Опубліковано 2020

Effect of tin on structural transformations in the thin-film silicon suboxide matrix

за авторством V. V. Voitovych, R. M. Rudenko, V. O. Yukhymchuk, M. V. Voitovych, M. M. Krasko, A. H. Kolosiuk, Yu. Povarchuk, I. M. Khatsevych, M. P. Rudenko
Опубліковано 2016

Behavior of hydrogen during crystallization of thin silicon films doped with tin

за авторством R. M. Rudenko, M. M. Krasko, V. V. Voitovych, A. H. Kolosiuk, Yu. Povarchuk, A. M. Kraichynskyi, V. O. Yukhymchuk, M. V. Voitovych, Ya. Bratus, I. A. Zaloilo
Опубліковано 2013