Concentration Dependence of Magnetic Properties of Binary B.C.C. Alloys with Substitutional Disorder von E. G. Len, V. V. Lizunov, T. S. Len, N. V. Ushakov, V. A. Tatarenko

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Magnetic Phase Diagrams of Two-Component Disordered B. C. C. Substitutional Alloys with Strong Electron Correlations von V. V. Lizunov, E. G. Len, I. N. Melnik, N. V. Ushakov, T. S. Len, V. A. Tatarenko

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Energy spectrum and electrical conductivity of systems with the strong electronic correlations von S. P. Repetskij, V. B. Molodkin, I. G. Vyshivanaja, E. G. Len, I. N. Melnik, O. I. Musienko, B. V. Stashchuk

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Double- and triple-crystal X-ray diffractometry of microdefects in silicon von V. B. Molodkin, S. I. Olikhovskii, Ye. M. Kyslovskyy, E. G. Len, O. V. Reshetnyk, T. P. Vladimirova, V. V. Lizunov, S. V. Lizunova

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Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of St... von V. B. Molodkin, S. I. Olikhovskii, E. S. Skakunova, E. G. Len, E. N. Kislovskii, O. V. Reshetnyk, T. P. Vladimirova, V. V. Lizunov, L. N. Skapa, S. V. Lizunova

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The Theory of the Dynamical Krivoglaz—Debye—Waller Factor von S. V. Dmitriev, R. V. Lekhnjak, V. B. Molodkin, V. V. Lizunov, L. N. Skapa, E. S. Skakunova, S. V. Lizunova, S. I. Olikhovskij, E. G. Len, N. G. Tolmachjov

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The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model von V. V. Lizunov, E. V. Kochelab, E. S. Skakunova, E. G. Len, V. B. Molodkin, S. I. Olikhovskij, N. G. Tolmachjov, B. V. Sheludchenko, S. V. Lizunova, L. N. Skapa

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The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. II. Numerical experiment von V. V. Lizunov, E. V. Kochelab, E. S. Skakunova, E. G. Len, V. B. Molodkin, S. I. Olikhovskij, N. G. Tolmachjov, B. V. Sheludchenko, S. V. Lizunova, L. N. Skapa

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Dispersion Effects of Interconnection of the Scattering Pattern Dependences on Different Diffraction Conditions and Huge Intensification of These Dependences and Their Structure Se... von L. N. Skapa, V. V. Lizunov, V. B. Molodkin, E. G. Len, B. V. Sheludchenko, S. V. Lizunova, E. S. Skakunova, N. G. Tolmachjov, S. V. Dmitriev, R. V. Lekhnjak

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Unique informativity of the diffuse dynamical combined diffractometry of materials and products of nanotechnologies von A. P. Shpak, M. V. Kovalchuk, I. M. Karnaukhov, V. V. Molodkin, E. G. Len, A. I. Nizkova, S. I. Olikhovskij, B. V. Sheludchenko, Dzh. E. Ajs, R. I. Barabash

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Integral multiparameter diffractometry of nanosystems on the basis of effects of multiplicity of diffuse scattering von A. P. Shpak, M. V. Kovalchuk, V. B. Molodkin, V. L. Nosik, S. V. Dmitriev, E. G. Len, S. I. Olikhovskij, A. I. Nizkova, V. V. Molodkin, E. V. Pervak, A. A. Katasonov, L. I. Ninichuk, A. V. Melnik

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Basic physics of multiparameter crystallography: diagnostics of defects of several types in single-crystal materials and articles of nanotechnologies von V. B. Molodkin, M. V. Kovalchuk, V. F. Machulin, Kh. Mukhamedzhanov, S. V. Lizunova, S. I. Olikhovskij, E. G. Len, B. V. Sheludchenko, S. V. Dmitriev, E. S. Skakunova, V. V. Molodkin, V. V. Lizunov, V. P. Kladko, E. V. Pervak

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