2025-02-22T16:58:01-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: Query fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-100103%22&qt=morelikethis&rows=5
2025-02-22T16:58:01-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-100103%22&qt=morelikethis&rows=5
2025-02-22T16:58:01-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-22T16:58:01-05:00 DEBUG: Deserialized SOLR response
Double- and triple-crystal X-ray diffractometry of microdefects in silicon

Double- and triple-crystal X-ray diffractometry of microdefects in silicon

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Bibliographic Details
Main Authors: V. B. Molodkin, S. I. Olikhovskii, Ye. M. Kyslovskyy, E. G. Len, O. V. Reshetnyk, T. P. Vladimirova, V. V. Lizunov, S. V. Lizunova
Format: Article
Language:English
Published: 2010
Series:Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0000349374
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Internet

http://jnas.nbuv.gov.ua/article/UJRN-0000349374

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