Concentration Dependence of Magnetic Properties of Binary B.C.C. Alloys with Substitutional Disorder by E. G. Len, V. V. Lizunov, T. S. Len, N. V. Ushakov, V. A. Tatarenko

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Magnetic Phase Diagrams of Two-Component Disordered B. C. C. Substitutional Alloys with Strong Electron Correlations by V. V. Lizunov, E. G. Len, I. N. Melnik, N. V. Ushakov, T. S. Len, V. A. Tatarenko

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Energy spectrum and electrical conductivity of systems with the strong electronic correlations by S. P. Repetskij, V. B. Molodkin, I. G. Vyshivanaja, E. G. Len, I. N. Melnik, O. I. Musienko, B. V. Stashchuk

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Double- and triple-crystal X-ray diffractometry of microdefects in silicon by V. B. Molodkin, S. I. Olikhovskii, Ye. M. Kyslovskyy, E. G. Len, O. V. Reshetnyk, T. P. Vladimirova, V. V. Lizunov, S. V. Lizunova

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Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of St... by V. B. Molodkin, S. I. Olikhovskii, E. S. Skakunova, E. G. Len, E. N. Kislovskii, O. V. Reshetnyk, T. P. Vladimirova, V. V. Lizunov, L. N. Skapa, S. V. Lizunova

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The Theory of the Dynamical Krivoglaz—Debye—Waller Factor by S. V. Dmitriev, R. V. Lekhnjak, V. B. Molodkin, V. V. Lizunov, L. N. Skapa, E. S. Skakunova, S. V. Lizunova, S. I. Olikhovskij, E. G. Len, N. G. Tolmachjov

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The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model by V. V. Lizunov, E. V. Kochelab, E. S. Skakunova, E. G. Len, V. B. Molodkin, S. I. Olikhovskij, N. G. Tolmachjov, B. V. Sheludchenko, S. V. Lizunova, L. N. Skapa

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The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. II. Numerical experiment by V. V. Lizunov, E. V. Kochelab, E. S. Skakunova, E. G. Len, V. B. Molodkin, S. I. Olikhovskij, N. G. Tolmachjov, B. V. Sheludchenko, S. V. Lizunova, L. N. Skapa

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Dispersion Effects of Interconnection of the Scattering Pattern Dependences on Different Diffraction Conditions and Huge Intensification of These Dependences and Their Structure Se... by L. N. Skapa, V. V. Lizunov, V. B. Molodkin, E. G. Len, B. V. Sheludchenko, S. V. Lizunova, E. S. Skakunova, N. G. Tolmachjov, S. V. Dmitriev, R. V. Lekhnjak

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Unique informativity of the diffuse dynamical combined diffractometry of materials and products of nanotechnologies by A. P. Shpak, M. V. Kovalchuk, I. M. Karnaukhov, V. V. Molodkin, E. G. Len, A. I. Nizkova, S. I. Olikhovskij, B. V. Sheludchenko, Dzh. E. Ajs, R. I. Barabash

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Integral multiparameter diffractometry of nanosystems on the basis of effects of multiplicity of diffuse scattering by A. P. Shpak, M. V. Kovalchuk, V. B. Molodkin, V. L. Nosik, S. V. Dmitriev, E. G. Len, S. I. Olikhovskij, A. I. Nizkova, V. V. Molodkin, E. V. Pervak, A. A. Katasonov, L. I. Ninichuk, A. V. Melnik

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Basic physics of multiparameter crystallography: diagnostics of defects of several types in single-crystal materials and articles of nanotechnologies by V. B. Molodkin, M. V. Kovalchuk, V. F. Machulin, Kh. Mukhamedzhanov, S. V. Lizunova, S. I. Olikhovskij, E. G. Len, B. V. Sheludchenko, S. V. Dmitriev, E. S. Skakunova, V. V. Molodkin, V. V. Lizunov, V. P. Kladko, E. V. Pervak

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