An analytical accumulation mode SOI pMOSFET model for high-temperature analog applications von Houk, Yu., Iniguez, B., Flandre, D., Nazarov, A.

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Revision of interface coupling in ultra-thin body silicon-on-insulator MOSFETs von Rudenko, T., Nazarov, A., Kilchytska, V., Flandre, D., Popov, V., Ilnitsky, M., Lysenko, V.

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Characterization of charge trapping processes in fully-depleted UNIBOND SOI MOSFET subjected to γ-irradiation von Houk, Y., Nazarov, A.N., Turchanikov, V.I., Lysenko, V.S., Andriaensen, S., Flandre, D.

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