Search Results - Flandre, D.
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Characterization of charge trapping processes in fully-depleted UNIBOND SOI MOSFET subjected to γ-irradiation by Houk, Y., Nazarov, A.N., Turchanikov, V.I., Lysenko, V.S., Andriaensen, S., Flandre, D.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2006)Get full text
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