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1

Determination of surface parameters of solids by methods of X-ray total external reflection by Balovsyak, S.V., Fodchuk, I.M., Lytvyn, P.M.

Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

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2

Character of elastic energy absorption in well developed genetic-impurity defect structure in monocrystalline silicon by Gutsulyak, B.I., Oliynych-Lysyuk, A.V., Fodchuk, I.M.

Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2005)

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3

Оптический аттенюатор by Doctorovych, I. V., Fodchuk, I. M., Butenko, V. K., Hodovaniouk, V. M., Yuryev, V. H.

Published 2005

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4

Методика калибровки УФ-радиометров энергетической освещенности by Doctorovich, I. V., Butenko, V. K., Hodovaniuk, V. N., Fodchuk, I. M., Yuriev, V. G.

Published 2008

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5

Метрологические характеристики яркомера "Тензор-28" by Fodchuk, I. M., Doktorovych, I. V., Godovaniouk, V. M., Butenko, V. K., Yuriev, V. G.

Published 2007

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6

Evolution of defective structure of the irradiated silicon during natural ageing by Fodchuk, I.M., Gutsulyak, T.G., Himchynsky, O.G., Olijnich-Lysjuk, A.V., Raransky, N.D.

Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

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7

Solid state doping of CdxHg₁₋xTe epitaxial layers with elements of V group by Vlasov, A.P., Bonchyk, A.Yu., Fodchuk, I.M., Barcz, A., Swiatek, Z.T., Zaplitnyy, R.A.

Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2006)

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8

Влияние нестабильности потока излучения ртутных ламп на калибровку приборов by Doktorovich, I. V., Fodchuk, I. M., Butenko, V. K., Godovanyuk, V. N., Ryukhtin, V. V., Yuryev, V. G.

Published 2006

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9

Structural changes in multilayer systems containing InxGa₁₋xAs₁₋yNy quantum wells by Fodchuk, I.M., Gevyk, V.B., Gimchinsky, O.G., Kislovskii, E.N., Kroytor, O.P., Molodkin, V.B., Olihovskii, S.I., Pavelescu, E.M., Pessa, M.

Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

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10

Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions by Fodchuk, I.M., Gutsuliak, I.I., Zaplitniy, R.A., Balovsyak, S.V., Yaremiy, I.P., Bonchyk, O.Yu., Savitskiy, G.V., Syvorotka, I.M., Lytvyn, P.M.

Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2013)

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11

Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals by Molodkin, V.B., Olikhovskii, S.I., Len, E.G., Kyslovskyy, Ye.M., Reshetnyk, O.V., Vladimirova, T.P., Sheludchenko, B.V., Skakunova, E.S., Lizunov, V.V., Kochelab, E.V., Fodchuk, I.M., Klad’ko, V.P.

Published in Металлофизика и новейшие технологии (2016)

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Article

Search Results - Fodchuk, I. M.

Determination of surface parameters of solids by methods of X-ray total external reflection by Balovsyak, S.V., Fodchuk, I.M., Lytvyn, P.M.

Character of elastic energy absorption in well developed genetic-impurity defect structure in monocrystalline silicon by Gutsulyak, B.I., Oliynych-Lysyuk, A.V., Fodchuk, I.M.

Оптический аттенюатор by Doctorovych, I. V., Fodchuk, I. M., Butenko, V. K., Hodovaniouk, V. M., Yuryev, V. H.

Методика калибровки УФ-радиометров энергетической освещенности by Doctorovich, I. V., Butenko, V. K., Hodovaniuk, V. N., Fodchuk, I. M., Yuriev, V. G.

Метрологические характеристики яркомера &quot;Тензор-28&quot; by Fodchuk, I. M., Doktorovych, I. V., Godovaniouk, V. M., Butenko, V. K., Yuriev, V. G.

Evolution of defective structure of the irradiated silicon during natural ageing by Fodchuk, I.M., Gutsulyak, T.G., Himchynsky, O.G., Olijnich-Lysjuk, A.V., Raransky, N.D.

Solid state doping of CdxHg₁₋xTe epitaxial layers with elements of V group by Vlasov, A.P., Bonchyk, A.Yu., Fodchuk, I.M., Barcz, A., Swiatek, Z.T., Zaplitnyy, R.A.

Влияние нестабильности потока излучения ртутных ламп на калибровку приборов by Doktorovich, I. V., Fodchuk, I. M., Butenko, V. K., Godovanyuk, V. N., Ryukhtin, V. V., Yuryev, V. G.

Structural changes in multilayer systems containing InxGa₁₋xAs₁₋yNy quantum wells by Fodchuk, I.M., Gevyk, V.B., Gimchinsky, O.G., Kislovskii, E.N., Kroytor, O.P., Molodkin, V.B., Olihovskii, S.I., Pavelescu, E.M., Pessa, M.

Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions by Fodchuk, I.M., Gutsuliak, I.I., Zaplitniy, R.A., Balovsyak, S.V., Yaremiy, I.P., Bonchyk, O.Yu., Savitskiy, G.V., Syvorotka, I.M., Lytvyn, P.M.

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Метрологические характеристики яркомера "Тензор-28" by Fodchuk, I. M., Doktorovych, I. V., Godovaniouk, V. M., Butenko, V. K., Yuriev, V. G.