Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals

• Veröffentlicht in: Металлофизика и новейшие технологии
• Datum: 2016
• Hauptverfasser: Molodkin, V.B., Olikhovskii, S.I., Len, E.G., Kyslovskyy, Ye.M., Reshetnyk, O.V., Vladimirova, T.P., Sheludchenko, B.V., Skakunova, E.S., Lizunov, V.V., Kochelab, E.V., Fodchuk, I.M., Klad’ko, V.P.
• Format: Artikel
• Sprache: English
• Veröffentlicht: Інститут металофізики ім. Г.В. Курдюмова НАН України 2016
• Schlagworte: Дефекты кристаллической решётки
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/112466
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals / V. B. Molodkin, S. I. Olikhovskii, E. G. Len, Ye. M. Kyslovskyy, O. V. Reshetnyk, T. P. Vladimirova, B. V. Sheludchenko, E. S. Skakunova, V. V. Lizunov, E. V. Kochelab, I. M. Fodchuk, and V. P. Klad’ko // Металлофизика и новейшие технологии. — 2016. — Т. 38, № 1. — С. 99-139. — Бібліогр.: 48 назв. — англ.

A short review of basic principles and limitations in obtaining the analytical expressions for the coherent and diffuse scattering intensities measured by the triple-crystal diffractometer (TCD) are presented. Explicit analytical expressions are given for both the diffuse components of TCD profiles...