Open Science Harvester of NAS of Ukraine

Determination of surface parameters of solids by methods of X-ray total external reflection

by Balovsyak, S.V., Fodchuk, I.M., Lytvyn, P.M.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Character of elastic energy absorption in well developed genetic-impurity defect structure in monocrystalline silicon

by Gutsulyak, B.I., Oliynych-Lysyuk, A.V., Fodchuk, I.M.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2005)

Evolution of defective structure of the irradiated silicon during natural ageing

by Fodchuk, I.M., Gutsulyak, T.G., Himchynsky, O.G., Olijnich-Lysjuk, A.V., Raransky, N.D.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Solid state doping of CdxHg₁₋xTe epitaxial layers with elements of V group

by Vlasov, A.P., Bonchyk, A.Yu., Fodchuk, I.M., Barcz, A., Swiatek, Z.T., Zaplitnyy, R.A.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2006)

Structural changes in multilayer systems containing InxGa₁₋xAs₁₋yNy quantum wells

by Fodchuk, I.M., Gevyk, V.B., Gimchinsky, O.G., Kislovskii, E.N., Kroytor, O.P., Molodkin, V.B., Olihovskii, S.I., Pavelescu, E.M., Pessa, M.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions

by Fodchuk, I.M., Gutsuliak, I.I., Zaplitniy, R.A., Balovsyak, S.V., Yaremiy, I.P., Bonchyk, O.Yu., Savitskiy, G.V., Syvorotka, I.M., Lytvyn, P.M.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2013)

Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals

by Molodkin, V.B., Olikhovskii, S.I., Len, E.G., Kyslovskyy, Ye.M., Reshetnyk, O.V., Vladimirova, T.P., Sheludchenko, B.V., Skakunova, E.S., Lizunov, V.V., Kochelab, E.V., Fodchuk, I.M., Klad’ko, V.P.
Published in Металлофизика и новейшие технологии (2016)