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  • Fomin, A.V.
Showing 1 - 3 results of 3 for search 'Fomin, A.V.', query time: 0.01s Refine Results
  1. 1
    Investigation of the effect of technological parameters on efficiency of chemical string cutting of semiconductor materials
    Investigation of the effect of technological parameters on efficiency of chemical string cutting of semiconductor materials
    by Kravetsky, M.Yu., Sypko, S.A., Fomin, A.V.
    Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2002)
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  2. 2
    Modeling the process of removal aimed at cut traces on semiconductor wafers by using the method of contactless chemical-and-dynamical polishing
    Modeling the process of removal aimed at cut traces on semiconductor wafers by using the method of contactless chemical-and-dynamical polishing
    by Pashchenko, G.A., Kravetskyi, M.Yu., Fomin, A.V.
    Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2015)
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  3. 3
    Balance model for contactless chemo-mechanical polishing of wafers
    Balance model for contactless chemo-mechanical polishing of wafers
    by Grigoriev, N.N., Kravetsky, M.Yu., Paschenko, G.A., Sypko, S.A., Fomin, A.V.
    Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2002)
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