X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector

by Mikhailov, I.F., Baturin, A.A., Fomina, L.P.
Published 2010

VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate

by Mikhailov, I.F., Malykhin, S.V., Borisova, S.S., Fomina, L.P.
Published 2006