Bi nanolines characterization by linear optical methods by Buchenko, V.V., Goloborodko, A.A.

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Speckle pattern formation in spatially limited optical systems by Kotov, M.M., Kurashov, V.N., Goloborodko, A.A.

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Simulating the diffraction grating reflectivity using effective medium theory by Goloborodko, A.A., Goloborodko, N.S., Oberemok, Ye.A., Savenkov, S.N.

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Сенсор талбота iз адаптацiєю дифракцiйної ґратки до аберацiй дослiджуваного хвильового фронту by Podanchuk, D. V., Goloborodko, A. A., Kotov, M. M., Petriv, D. A.

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Determination of surface defects by using the wavefront scanner by Goloborodko, N.S., Grygoruk, V.I., Kurashov, V.N., Podanchuk, D.V., Goloborodko, A.A., Kotov, M.M.

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