Bi nanolines characterization by linear optical methods von Buchenko, V.V., Goloborodko, A.A.

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Speckle pattern formation in spatially limited optical systems von Kotov, M.M., Kurashov, V.N., Goloborodko, A.A.

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Simulating the diffraction grating reflectivity using effective medium theory von Goloborodko, A.A., Goloborodko, N.S., Oberemok, Ye.A., Savenkov, S.N.

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Determination of surface defects by using the wavefront scanner von Goloborodko, N.S., Grygoruk, V.I., Kurashov, V.N., Podanchuk, D.V., Goloborodko, A.A., Kotov, M.M.

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