Search Results - Gomeniuk, Y.V.

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    Effect of oxide-semiconductor interface traps on low-temperature operation of MOSFETs by Lysenko, V.S., Tyagulski, I.P., Gomeniuk, Y.V., Osiyuk, I.N.

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    Effect of the charge state of traps on the transport current in the SiC/Si heterostructure by Lysenko, V.S., Tyagulski, I.P., Gomeniuk, Y.V., Osiyuk, I.N.

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    Properties of SiGe/Si heterostructures fabricated by ion implantation technique by Gomeniuk, Y.V., Lysenko, V.S., Osiyuk, I.N., Tyagulski, I.P., Valakh, M.Ya., Yukhimchuk, V.A., Willander, M., Patel, C.J.

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