Current transport mechanisms in metal – high-k dielectric – silicon structures von Gomeniuk, Y.V.

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Effect of oxide-semiconductor interface traps on low-temperature operation of MOSFETs von Lysenko, V.S., Tyagulski, I.P., Gomeniuk, Y.V., Osiyuk, I.N.

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Effect of the charge state of traps on the transport current in the SiC/Si heterostructure von Lysenko, V.S., Tyagulski, I.P., Gomeniuk, Y.V., Osiyuk, I.N.

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Properties of SiGe/Si heterostructures fabricated by ion implantation technique von Gomeniuk, Y.V., Lysenko, V.S., Osiyuk, I.N., Tyagulski, I.P., Valakh, M.Ya., Yukhimchuk, V.A., Willander, M., Patel, C.J.

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Novel hysteresis effect in ultrathin epitaxial Gd₂O₃ high-k dielectric von Nazarov, A.N., Gomeniuk, Y.V., Gomeniuk, Y.Y., Lysenko, V.S., Gottlob, H.D.B., Schmidt, M., Lemme, M.C., Czernohorsky, M., Ostenc, H.J.

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