Investigation of the undersurface damaged layers in silicon wafers за авторством Holiney, R.Yu., Matveeva, L.A., Venger, E.F.

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Electron beam application for mechanical stress relaxation and for SI-SIO₂ interface structural regulation за авторством Matveeva, L.A., Vanger, E.F., Holiney, R.Yu.

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Electroreflectance spectroscopy and scanning electron microscopy study of microrelief silicon wafers with various surface pretreatments за авторством Gorbach, T.Ya., Holiney, R.Yu., Matiyuk, I.M., Matveeva, L.A., Svechnikov, S.V., Venger, E.F.

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Influence of neutron irradiation on elctrooptical and structural properties of silicon за авторством Groza, A.A., Venger, E.F., Varnina, V.I., Holiney, R.Yu., Litovchenko, P.G., Matveeva, L.A., Litovchenko, A.P., Sugakov, V.I., Shmatko, G.G.

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