Харвестер відкритої науки НАН України

Electron beam application for mechanical stress relaxation and for SI-SIO₂ interface structural regulation

von Matveeva, L.A., Vanger, E.F., Holiney, R.Yu.
Veröffentlicht in Вопросы атомной науки и техники (1999)

Investigation of the undersurface damaged layers in silicon wafers

von Holiney, R.Yu., Matveeva, L.A., Venger, E.F.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (1999)

Electroreflectance spectroscopy and scanning electron microscopy study of microrelief silicon wafers with various surface pretreatments

von Gorbach, T.Ya., Holiney, R.Yu., Matiyuk, I.M., Matveeva, L.A., Svechnikov, S.V., Venger, E.F.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (1998)

Influence of neutron irradiation on elctrooptical and structural properties of silicon

von Groza, A.A., Venger, E.F., Varnina, V.I., Holiney, R.Yu., Litovchenko, P.G., Matveeva, L.A., Litovchenko, A.P., Sugakov, V.I., Shmatko, G.G.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2001)