Investigation of the undersurface damaged layers in silicon wafers von Holiney, R.Yu., Matveeva, L.A., Venger, E.F.

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Electron beam application for mechanical stress relaxation and for SI-SIO₂ interface structural regulation von Matveeva, L.A., Vanger, E.F., Holiney, R.Yu.

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Electroreflectance spectroscopy and scanning electron microscopy study of microrelief silicon wafers with various surface pretreatments von Gorbach, T.Ya., Holiney, R.Yu., Matiyuk, I.M., Matveeva, L.A., Svechnikov, S.V., Venger, E.F.

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Influence of neutron irradiation on elctrooptical and structural properties of silicon von Groza, A.A., Venger, E.F., Varnina, V.I., Holiney, R.Yu., Litovchenko, P.G., Matveeva, L.A., Litovchenko, A.P., Sugakov, V.I., Shmatko, G.G.

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