Open Science Harvester of NAS of Ukraine

Electron beam application for mechanical stress relaxation and for SI-SIO₂ interface structural regulation

by Matveeva, L.A., Vanger, E.F., Holiney, R.Yu.
Published in Вопросы атомной науки и техники (1999)

Investigation of the undersurface damaged layers in silicon wafers

by Holiney, R.Yu., Matveeva, L.A., Venger, E.F.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (1999)

Electroreflectance spectroscopy and scanning electron microscopy study of microrelief silicon wafers with various surface pretreatments

by Gorbach, T.Ya., Holiney, R.Yu., Matiyuk, I.M., Matveeva, L.A., Svechnikov, S.V., Venger, E.F.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (1998)

Influence of neutron irradiation on elctrooptical and structural properties of silicon

by Groza, A.A., Venger, E.F., Varnina, V.I., Holiney, R.Yu., Litovchenko, P.G., Matveeva, L.A., Litovchenko, A.P., Sugakov, V.I., Shmatko, G.G.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2001)