Харвестер відкритої науки НАН України

Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique

за авторством T. S. Rozouvan, L. V. Poperenko, I. A. Shaykevich
Опубліковано 2015

London forces in highly oriented pyrolytic graphite

за авторством L. V. Poperenko, S. G. Rozouvan, I. A. Shaykevich
Опубліковано 2017

Optical properties of graphene film growing on a thin copper layer

за авторством T. S. Rozouvan, L. V. Poperenko, V. G. Kravets, I. A. Shaykevich
Опубліковано 2016

The role of magnetic component of a strong light field in electrostrictive effect

за авторством L. V. Poperenko, V. V. Prorok, S. G. Rozouvan, I. A. Shaykevich
Опубліковано 2018

Optical properties of thin films of titanium with transient layers on them

за авторством V. V. Lendel, O. V. Lomakina, Yu. Melnychenko, I. A. Shaykevich
Опубліковано 2010

Ellipsometry and optical spectroscopy of low-dimensional family TMDs

за авторством V. G. Kravets, V. V. Prorok, L. V. Poperenko, I. A. Shaykevich
Опубліковано 2017