Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique von T. S. Rozouvan, L. V. Poperenko, I. A. Shaykevich

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London forces in highly oriented pyrolytic graphite von L. V. Poperenko, S. G. Rozouvan, I. A. Shaykevich

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Optical properties of graphene film growing on a thin copper layer von T. S. Rozouvan, L. V. Poperenko, V. G. Kravets, I. A. Shaykevich

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Optical properties of thin films of titanium with transient layers on them von V. V. Lendel, O. V. Lomakina, Yu. Melnychenko, I. A. Shaykevich

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The role of magnetic component of a strong light field in electrostrictive effect von L. V. Poperenko, V. V. Prorok, S. G. Rozouvan, I. A. Shaykevich

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Ellipsometry and optical spectroscopy of low-dimensional family TMDs von V. G. Kravets, V. V. Prorok, L. V. Poperenko, I. A. Shaykevich

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