Search Results - Kovalenko, Yu.I.
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Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics by Vashchenko, V.A., Yatsenko, I.V., Kovalenko, Yu.I., Kladko, V.P., Gudymenko, O.Yo., Lytvyn, P.M., Korchovyi, A.A., Mamykin, S.V., Kondratenko, O.S., Maslov, V.P., Dorozinska, H.V., Dorozinsky, G.V.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2019)Get full text
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