Search Results - Kuznetsov, G.V.

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    The influence of surface defects on the pinhole formation in silicide thin film by Belousov, I.V., Grib, A.N., Kuznetsov, G.V.

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    Aвтоматизированный спектрометр глубоких уровней для исследования полупроводниковых структур by Boiko, Yu. V., Kuznetsov, G. V., Savitsky, S. М., Tretyak, O. V.

    Published 2007
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    Electrophysical properties of meso-porous silicon free standing films modified with palladium by Manilov, A.I., Skryshevsky, V.A., Alekseev, S.A., Kuznetsov, G.V.

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