Open Science Harvester of NAS of Ukraine

Double- and triple-crystal X-ray diffractometry of microdefects in silicon

by Molodkin, V.B., Olikhovskii, S.I., Kyslovskyy, Ye.M., Len, E.G., Reshetnyk, O.V., Vladimirova, T.P., V.V. Lizunov, V.V., Lizunova, S.V.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2010)

Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of St...

by Molodkin, V.B., Olikhovskii, S.I., Skakunova, E.S., Len, E.G., Kislovskii, E.N., Reshetnyk, O.V., Vladimirova, T.P., Lizunov, V.V., Skapa, L.N., Lizunova, S.V., Fuzik, E.V., Tolmachev, N.G., Ostafiychuk, B.K., Pylypiv, V.M., Garpul’, O.Z.
Published in Металлофизика и новейшие технологии (2015)

Models of Deformation Dependences of Total Integrated Intensity of Dynamical Diffraction in Single Crystals for Various Diffraction Conditions

by Brovchuk, S.M., Molodkin, V.B., Nizkova, A.I., Rudnytska, I.I., Grankina, G.L., Lizunov, V.V., Lizunova, S.V., Sheludchenko, B.V., Skakunova, E.S., Dmitriev, S.V., Zabolotnyi, I.N., Katasonov, A.A., Zhuravlev, B.F., Lekhnyak, R.V., Skapa, L.N., Irha, N.P.
Published in Металлофизика и новейшие технологии (2014)