Determination of refractive index dispersion and thickness of thin antireflection films TiO₂ and Si₃N₄ on surfaces of silicon photoelectric converters von Donets, V.V., Melnichenko, L.Y., Shaykevich, I.A., Lomakina, O.V.

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Optical properties of thin films of titanium with transient layers on them von Lendel, V.V., Lomakina, O.V., Mel’nychenko, L.Yu., Shaykevich, I.A.

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