Optical properties of thin films of titanium with transient layers on them

Within the Beattie spectroellipsometric method, we measured the ellipsometric
 parameters of thin Ті films deposited onto glass substrates by magnetron sputtering in
 argon atmosphere. Measurements were carried out at five angles of incidence with light
 from the visible and...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2010
Main Authors: Lendel, V.V., Lomakina, O.V., Mel’nychenko, L.Yu., Shaykevich, I.A.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2010
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/118394
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Optical properties of thin films of titanium
 with transient layers on them /V.V. Lendel, O.V. Lomakina, L.Yu. Mel’nychenko, I.A. Shaykevich // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 231-234. — Бібліогр.: 9 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine