Харвестер відкритої науки НАН України

Structure perfection of sapphire single crystals grown by HOC method in reducing atmosphere

von Tkachenko, V.F., Lukienko, O.A., Budnikov, A.T., Vovk, E.A., Krivonogov, S.I.
Veröffentlicht in Functional Materials (2011)

Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method

von Tkachenko, V.F., Kryvonogov, S.I., Budnikov, A.T., Lukienko, O.A., Vovk, E.A.
Veröffentlicht in Functional Materials (2014)

Structure perfection of bulk and near-surface layers in sapphire single crystals

von Tkachenko, V.F., Puzikov, V.M., Dan`ko, A.Ya., Budnikov, A.T., Lukienko, O.A.
Veröffentlicht in Functional Materials (2007)

XRD studies of surface layers in sapphire substrates of <101Bar2> crystalloghaphic orientation

von Tkachenko, V.F., Lukienko, O.A., Budnikov, A.T., Vovk, E.A., Krivonogov, S.I., Dan`ko, A.Ya.
Veröffentlicht in Functional Materials (2011)

Study of nature of some defects visible in polarized light in sapphire signle crystals

von Tkachenko, V.F., Dan`ko, A.Ya., Puzikov, V.M., Budnikov, A.T., Lukienko, O.A., Sidelnikova, N.S., Adonkin, G.T.
Veröffentlicht in Functional Materials (2007)