Structure perfection of bulk and near-surface layers in sapphire single crystals
Triple-crystal X-ray diffractometry has been used to study the structure perfection in bulk and surface layer of basal-oriented sapphire single crystals grown using horizontal directional crystallization (HDC) in reducing atmosphere by the Czochralski technique and machined and annealed in various m...
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| Published in: | Functional Materials |
|---|---|
| Date: | 2007 |
| Main Authors: | , , , , |
| Format: | Article |
| Language: | English |
| Published: |
НТК «Інститут монокристалів» НАН України
2007
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| Subjects: | |
| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/136939 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Structure perfection of bulk and near-surface layers in sapphire single crystals / V.F. Tkachenko, V.M. Puzikov, A.Ya. Dan`ko, A.T. Budnikov, O.A. Lukienko // Functional Materials. — 2007. — Т. 14, № 4. — С. 550-554. — Бібліогр.: 7 назв. — англ. |