Structure perfection of bulk and near-surface layers in sapphire single crystals

• Veröffentlicht in: Functional Materials
• Datum: 2007
• Hauptverfasser: Tkachenko, V.F., Puzikov, V.M., Dan`ko, A.Ya., Budnikov, A.T., Lukienko, O.A.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: НТК «Інститут монокристалів» НАН України 2007
• Schlagworte: Technology
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/136939
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Structure perfection of bulk and near-surface layers in sapphire single crystals / V.F. Tkachenko, V.M. Puzikov, A.Ya. Dan`ko, A.T. Budnikov, O.A. Lukienko // Functional Materials. — 2007. — Т. 14, № 4. — С. 550-554. — Бібліогр.: 7 назв. — англ.

Triple-crystal X-ray diffractometry has been used to study the structure perfection in bulk and surface layer of basal-oriented sapphire single crystals grown using horizontal directional crystallization (HDC) in reducing atmosphere by the Czochralski technique and machined and annealed in various m...