Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method за авторством Tkachenko, V.F., Kryvonogov, S.I., Budnikov, A.T., Lukienko, O.A., Vovk, E.A.

Отримати повний текст

Structure perfection of sapphire single crystals grown by HOC method in reducing atmosphere за авторством Tkachenko, V.F., Lukienko, O.A., Budnikov, A.T., Vovk, E.A., Krivonogov, S.I.

Отримати повний текст

Structure perfection of bulk and near-surface layers in sapphire single crystals за авторством Tkachenko, V.F., Puzikov, V.M., Dan`ko, A.Ya., Budnikov, A.T., Lukienko, O.A.

Отримати повний текст

XRD studies of surface layers in sapphire substrates of <101Bar2> crystalloghaphic orientation за авторством Tkachenko, V.F., Lukienko, O.A., Budnikov, A.T., Vovk, E.A., Krivonogov, S.I., Dan`ko, A.Ya.

Отримати повний текст

Study of nature of some defects visible in polarized light in sapphire signle crystals за авторством Tkachenko, V.F., Dan`ko, A.Ya., Puzikov, V.M., Budnikov, A.T., Lukienko, O.A., Sidelnikova, N.S., Adonkin, G.T.

Отримати повний текст