Structural and composition irregularities in GaAs:Si/GaAs films grown by liquid-phase epitaxy by Kladko, V.P., Datsenko, L.I., Maksimenko, Z.V., Lytvyn, O.S., Prokopenko, I.V., Zytkiewicz, Z.

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Complex diffractometrical investigation of structural and compositional irregularities in GaAs:Si/GaAs films heavily doped with silicon by Datsenko, L.I., Klad’ko, V.P., Lytvyn, P.M., Domagala, J., Machulin, V.F., Prokopenko, I.V., Molodkin, V.B., Maksimenko, Z.V.

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Phase transition in vanadium oxide films formed by multistep deposition by Kladko, V.P., Melnik, V.P., Liubchenko, О.I., Romanyuk, B.M., Gudymenko, О.Yo., Sabov, Т.M., Dubikovskyi, О.V., Maksimenko, Z.V., Kosulya, О.V., Kulbachynskyi, O.A., Lytvyn, P.M., Efremov, О.O.

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