Multilayer film heterostructures. Silicides von Sidorenko, S.I., Makogon, Yu.N., Pavlova, E.P., Voloshko, S.M.

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Ellipsometric evidence of CoSi₂ formation in Co/Si multilayer induced by thermal annealing von Kudryavtsev, Y.V., Lee, Y.P., Hyun, Y.H., Pavlova, E.P., Makogon, Y.N.

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Optical and Magnetooptical Spectroscopy of the Nanostructural Multilayered Films: Possible Applications von Kudryavtsev, Yu.V., Uvarov, V.M., Gontarz, R., Dubowik, J., Lee, Y.P., Rhee, J.Y., Makogon, Yu.N., Pavlova, E.P.

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Formation and thermal stability of NiSi phase in Ni (30 nm)/Pt (2 nm; 6 nm)/Siep. (50 nm)/Si (001) thin film systems von Makogon, Iu.N., Pavlova, E.P., Sidorenko, S.I., Beddies, G., Beke, D.L., Csik, A., Verbitska, T.I., Fihurna, E.V., Shkarban, R.A.

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