Physical mechanisms providing formation of ohmic contacts metal-semiconductor (Review) by A. V. Sachenko, R. V. Konakova, Ye. Belyaev

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Effect of weak magnetic fields treatment on photoluminescence of III-V single crystals by R. V. Konakova, S. M. Redko, V. V. Milenin, R. A. Redko

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Influence of pulse magnetic fields treatment on optical properties of GaAs based films by R. V. Konakova, M. V. Sosnova, S. M. Redko, V. V. Milenin, R. A. Redko

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Mechanisms of contact resistance formation in ohmic contacts with high dislocation density (review) by A. V. Sachenko, A. E. Beljaev, N. S. Boltovets, R. V. Konakova, V. N. Sheremet

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Estimation of field-emission properties of nanostructures based on silicon carbide and graphene by O. B. Okhrimenko, R. V. Konakova, A. M. Svetlichnyj, O. B. Spiridonov, Ju. Volkov

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Interface features of SiO2/SiC heterostructures according to methods for producing the SiO2 thin films by Yu. Yu. Bacherikov, N. S. Boltovets, R. V. Konakova, Yu. Kolyadina, T. M. Lednova, O. B. Okhrimenko

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Peculiarities of study of Au–Ti–Pd–n+-n-n+-Si multilayer contact structure to avalanche transit-time diodes by P. M. Romanets, R. V. Konakova, M. S. Boltovets, V. V. Basanets, Ya. Ya. Kudryk, V. S. Slipokurov

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Temperature dependence of contact resistance of Au Ti Pd2Si n+-Si ohmic contacts by A. E. Belyaev, N. S. Boltovets, R. V. Konakova, Ya. Ya. Kudryk, A. V. Sachenko, V. N. Sheremet

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Optical properties of irradiated epitaxial GaN films by Ye. Bieliaiev, M. I. Kliui, R. V. Konakova, A. M. Lukianov, Yu. M. Sveshnikov, A. M. Kliui

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Optical properties of thin erbium oxide films formed by rapid thermal annealing on SiC substrates with different structures by Yu. Yu. Bacherikov, R. V. Konakova, O. B. Okhrimenko, N. I. Berezovska, L. M. Kapitanchuk, A. M. Svetlichnyi

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Optical properties of irradiated epitaxial GaN films by A. E. Belyaev, N. I. Klyui, R. V. Konakova, A. M. Lukyanov, Yu. M. Sveshnikov, A. M. Klyui

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X-ray diffraction study of deformation state in InGaN/GaN multilayered structures by V. P. Kladko, A. V. Kuchuk, N. V. Safryuk, V. F. Machulin, A. E. Belyaev, R. V. Konakova, B. S. Yavich

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Thin dysprosium oxide films formed by rapid thermal annealing on porous SiC substrates by Yu. Yu. Bacherikov, R. V. Konakova, O. B. Okhrimenko, N. I. Berezovska, O. S. Lytvyn, L. M. Kapitanchuk, A. M. Svetlichnyi

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Technique and setup for diagnostics of p-n junction to case thermal resistance in high-power gallium nitride LEDs by V. M. Sorokin, R. V. Konakova, Ya. Ya. Kudryk, A. V. Zinovchuk, R. I. Bigun, Ya. Kudryk, V. V. Shynkarenko

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Some aspects of thermal resistance measurement technique for IMPATT and light-emitting diodes by A. E. Belyaev, N. S. Boltovets, R. V. Konakova, Ya. Ya. Kudryk, V. M. Sorokin, V. N. Sheremet, V. V. Shynkarenko

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Effect of microwave radiation on I V curves and contact resistivity of ohmic contacts to n-GaN and n-AlN by A. E. Belyaev, N. S. Boltovets, Yu. V. Zhilyaev, V. S. Zhigunov, R. V. Konakova, V. N. Panteleev, A. V. Sachenko, V. N. Sheremet

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Formation of ohmic contacts to n(p)-gan and measurement of their contact resistivity by M. S. Boltovets, V. M. Ivanov, R. V. Konakova, Ya. Ya. Kudryk, V. V. Milenin, V. V. Shynkarenko, V. M. Sheremet, Yu. N. Sveshnikov, B. S. Yavich

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Method for data processing in application to ohmic contacts by A. E. Belyaev, N. S. Boltovets, R. V. Konakova, V. M. Kovtonjuk, Ya. Ya. Kudryk, V. V. Shynkarenko, M. M. Dub, P. O. Saj, S. V. Novitskii

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Features of transformation of impurity-defect complexes in SdTe:Sl under the influence of microwave radiation by S. I. Budzuljak, D. V. Korbutjak, A. P. Lotsko, N. D. Vakhnjak, S. M. Kalitchuk, L. A. Demchina, R. V. Konakova, V. V. Shinkarenko, A. V. Melnichuk

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Comparison of properties inherent to thin titanium oxide films formed by rapid thermal annealing on SiC and porous SiC substrates by Yu. Yu. Bacherikov, N. L. Dmitruk, R. V. Konakova, O. F. Kolomys, O. B. Okhrimenko, V. V. Strelchuk, O. S. Lytvyn, L. M. Kapitanchuk, A. M. Svetlichnyi

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