Ultrasound effect on radiation damages in boron implanted silicon von Romanjuk, B., Krüger, D., Melnik, V., Popov, V., Olikh, Ya., Soroka, V., Oberemok, O.

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Strain relaxation in thin Si₁-ₓ-yGeₓCy layers on Si substrates von Valakh, M.Ya., Gamov, D.V., Dzhagan, V.M., Lytvyn, O.S., Melnik, V.P., Romanjuk, B.M., Popov, V.G., Yukhymchuk, V.O.

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