Open Science Harvester of NAS of Ukraine

Прибор и методы измерения параметров и степени однородности пленочных структур

by Makara, V. A., Odarych, V. A., Kepich, T. Yu., Preobragenskaya, T. D., Rudenko, O. V.
Published 2009

Evidence for photochemical transformations in porous silicon

by Shevchenko, V.B., Makara, V.A., Vakulenko, O.V., Dacenko, O.I., Rudenko, O.V.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (1999)

Relation between structure inhomogeneities and relaxation processes in excited silicon crystals

by Makara, V.A., Kolomiets, A.M., Kolchenko, Yu.L., Naumenko, S.M., Rudenko, O.V., Steblenko, L.P.
Published in Functional Materials (2004)

Comprehensive studies of defect production and strained states in silicon epitaxial layers and device structures based on them

by Boltovets, N.S., Voitsikhovskyi, D.I., Konakova, R.V., Milenin, V.V., Makara, V.A., Rudenko, O.V., Mel’nichenko, M.M.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2001)