Прибор и методы измерения параметров и степени однородности пленочных структур von Makara, V. A., Odarych, V. A., Kepich, T. Yu., Preobragenskaya, T. D., Rudenko, O. V.

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Evidence for photochemical transformations in porous silicon von Shevchenko, V.B., Makara, V.A., Vakulenko, O.V., Dacenko, O.I., Rudenko, O.V.

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Relation between structure inhomogeneities and relaxation processes in excited silicon crystals von Makara, V.A., Kolomiets, A.M., Kolchenko, Yu.L., Naumenko, S.M., Rudenko, O.V., Steblenko, L.P.

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Comprehensive studies of defect production and strained states in silicon epitaxial layers and device structures based on them von Boltovets, N.S., Voitsikhovskyi, D.I., Konakova, R.V., Milenin, V.V., Makara, V.A., Rudenko, O.V., Mel’nichenko, M.M.

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