Transformations of microdefect structure in silicon crystals under the influence of weak magnetic field

за авторством T. P. Vladimirova, Ye. M. Kyslovs`kyy, V. B. Molodkin, S. I. Olikhovskii, O. V. Koplak, E. V. Kochelab
Опубліковано 2011

Double- and triple-crystal X-ray diffractometry of microdefects in silicon

за авторством V. B. Molodkin, S. I. Olikhovskii, Ye. M. Kyslovskyy, E. G. Len, O. V. Reshetnyk, T. P. Vladimirova, V. V. Lizunov, S. V. Lizunova
Опубліковано 2010

Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of St...

за авторством V. B. Molodkin, S. I. Olikhovskii, E. S. Skakunova, E. G. Len, E. N. Kislovskii, O. V. Reshetnyk, T. P. Vladimirova, V. V. Lizunov, L. N. Skapa, S. V. Lizunova
Опубліковано 2015