Transformations of microdefect structure in silicon crystals under the influence of weak magnetic field

by T. P. Vladimirova, Ye. M. Kyslovs`kyy, V. B. Molodkin, S. I. Olikhovskii, O. V. Koplak, E. V. Kochelab
Published 2011

Double- and triple-crystal X-ray diffractometry of microdefects in silicon

by V. B. Molodkin, S. I. Olikhovskii, Ye. M. Kyslovskyy, E. G. Len, O. V. Reshetnyk, T. P. Vladimirova, V. V. Lizunov, S. V. Lizunova
Published 2010

Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of St...

by V. B. Molodkin, S. I. Olikhovskii, E. S. Skakunova, E. G. Len, E. N. Kislovskii, O. V. Reshetnyk, T. P. Vladimirova, V. V. Lizunov, L. N. Skapa, S. V. Lizunova
Published 2015