Spatial resolution of scanning tunneling microscopy by Rozouvan, T., Poperenko, L., Shaykevich, I., Rozouvan, S.

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Optical properties, form of granules and electronic parameters of binary Al/Cr composites by Shaykevich, I.A., Kolesnyk, P.V.

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Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique by Rozouvan, T.S., Poperenko, L.V., Shaykevich, I.A.

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Ellipsometric investigation of β-Si₃N₄ ceramics with Mo and Al additives by Prokopets', V.M., Shaykevich, I.A., Robur, L.Y.

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Angular dependences of ellipsometric parameters of thin Cr and Ti films under surface polariton excitation by Shybiko, Ya.A., Shaykevich, I.A., Melnichenko, L.Yu.

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London forces in highly oriented pyrolytic graphite by Poperenko, L.V., Rozouvan, S.G., Shaykevich, I.A.

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Influence of surface dimensional effects and interband transitions on absorption of light in aluminium by Mеlnichenko, L.Yu., Tytarchuk, B.B., Shaykevich, I.A.

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Optical properties of graphene film growing on a thin copper layer by Rozouvan, T.S., Poperenko, L.V., Kravets, V.G., Shaykevich, I.A.

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Determination of refractive index dispersion and thickness of thin antireflection films TiO₂ and Si₃N₄ on surfaces of silicon photoelectric converters by Donets, V.V., Melnichenko, L.Y., Shaykevich, I.A., Lomakina, O.V.

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Ellipsometry and optical spectroscopy of low-dimensional family TMDs by Kravets, V.G., Prorok, V.V., Poperenko, L.V., Shaykevich, I.A.

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The role of the magnetic component of a strong light field in the electrostrictive effect by Poperenko, L.V., Prorok, V.V., Rozouvan, S.G., Shaykevich, I.A.

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Optical properties of thin films of titanium with transient layers on them by Lendel, V.V., Lomakina, O.V., Mel’nychenko, L.Yu., Shaykevich, I.A.

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