Optical properties, form of granules and electronic parameters of binary Al/Cr composites by Shaykevich, I.A., Kolesnyk, P.V.

Get full text

Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique by Rozouvan, T.S., Poperenko, L.V., Shaykevich, I.A.

Get full text

Ellipsometric investigation of β-Si₃N₄ ceramics with Mo and Al additives by Prokopets', V.M., Shaykevich, I.A., Robur, L.Y.

Get full text

Angular dependences of ellipsometric parameters of thin Cr and Ti films under surface polariton excitation by Shybiko, Ya.A., Shaykevich, I.A., Melnichenko, L.Yu.

Get full text

London forces in highly oriented pyrolytic graphite by Poperenko, L.V., Rozouvan, S.G., Shaykevich, I.A.

Get full text

Optical properties of graphene film growing on a thin copper layer by Rozouvan, T.S., Poperenko, L.V., Kravets, V.G., Shaykevich, I.A.

Get full text

Ellipsometry and optical spectroscopy of low-dimensional family TMDs by Kravets, V.G., Prorok, V.V., Poperenko, L.V., Shaykevich, I.A.

Get full text

The role of the magnetic component of a strong light field in the electrostrictive effect by Poperenko, L.V., Prorok, V.V., Rozouvan, S.G., Shaykevich, I.A.

Get full text