Open Science Harvester of NAS of Ukraine

Optical properties, form of granules and electronic parameters of binary Al/Cr composites

by Shaykevich, I.A., Kolesnyk, P.V.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2000)

Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique

by Rozouvan, T.S., Poperenko, L.V., Shaykevich, I.A.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2015)

Angular dependences of ellipsometric parameters of thin Cr and Ti films under surface polariton excitation

by Shybiko, Ya.A., Shaykevich, I.A., Melnichenko, L.Yu.
Published in Functional Materials (2006)

Ellipsometric investigation of β-Si₃N₄ ceramics with Mo and Al additives

by Prokopets', V.M., Shaykevich, I.A., Robur, L.Y.
Published in Functional Materials (2005)

Optical properties of graphene film growing on a thin copper layer

by Rozouvan, T.S., Poperenko, L.V., Kravets, V.G., Shaykevich, I.A.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2016)

Influence of surface dimensional effects and interband transitions on absorption of light in aluminium

by Mеlnichenko, L.Yu., Tytarchuk, B.B., Shaykevich, I.A.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2002)

Determination of refractive index dispersion and thickness of thin antireflection films TiO₂ and Si₃N₄ on surfaces of silicon photoelectric converters

by Donets, V.V., Melnichenko, L.Y., Shaykevich, I.A., Lomakina, O.V.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2009)

Optical properties of thin films of titanium with transient layers on them

by Lendel, V.V., Lomakina, O.V., Mel’nychenko, L.Yu., Shaykevich, I.A.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2010)