Optical properties, form of granules and electronic parameters of binary Al/Cr composites

за авторством Shaykevich, I.A., Kolesnyk, P.V.
Опубліковано 2000

Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique

за авторством Rozouvan, T.S., Poperenko, L.V., Shaykevich, I.A.
Опубліковано 2015

Angular dependences of ellipsometric parameters of thin Cr and Ti films under surface polariton excitation

за авторством Shybiko, Ya.A., Shaykevich, I.A., Melnichenko, L.Yu.
Опубліковано 2006

Ellipsometric investigation of β-Si₃N₄ ceramics with Mo and Al additives

за авторством Prokopets', V.M., Shaykevich, I.A., Robur, L.Y.
Опубліковано 2005

Influence of surface dimensional effects and interband transitions on absorption of light in aluminium

за авторством Mеlnichenko, L.Yu., Tytarchuk, B.B., Shaykevich, I.A.
Опубліковано 2002

Optical properties of graphene film growing on a thin copper layer

за авторством Rozouvan, T.S., Poperenko, L.V., Kravets, V.G., Shaykevich, I.A.
Опубліковано 2016

Determination of refractive index dispersion and thickness of thin antireflection films TiO₂ and Si₃N₄ on surfaces of silicon photoelectric converters

за авторством Donets, V.V., Melnichenko, L.Y., Shaykevich, I.A., Lomakina, O.V.
Опубліковано 2009

Optical properties of thin films of titanium with transient layers on them

за авторством Lendel, V.V., Lomakina, O.V., Mel’nychenko, L.Yu., Shaykevich, I.A.
Опубліковано 2010