Optical properties, form of granules and electronic parameters of binary Al/Cr composites von Shaykevich, I.A., Kolesnyk, P.V.

Volltext

Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique von Rozouvan, T.S., Poperenko, L.V., Shaykevich, I.A.

Volltext

Ellipsometric investigation of β-Si₃N₄ ceramics with Mo and Al additives von Prokopets', V.M., Shaykevich, I.A., Robur, L.Y.

Volltext

Angular dependences of ellipsometric parameters of thin Cr and Ti films under surface polariton excitation von Shybiko, Ya.A., Shaykevich, I.A., Melnichenko, L.Yu.

Volltext

London forces in highly oriented pyrolytic graphite von Poperenko, L.V., Rozouvan, S.G., Shaykevich, I.A.

Volltext

Optical properties of graphene film growing on a thin copper layer von Rozouvan, T.S., Poperenko, L.V., Kravets, V.G., Shaykevich, I.A.

Volltext

Ellipsometry and optical spectroscopy of low-dimensional family TMDs von Kravets, V.G., Prorok, V.V., Poperenko, L.V., Shaykevich, I.A.

Volltext

The role of the magnetic component of a strong light field in the electrostrictive effect von Poperenko, L.V., Prorok, V.V., Rozouvan, S.G., Shaykevich, I.A.

Volltext