Харвестер відкритої науки НАН України

Optical properties, form of granules and electronic parameters of binary Al/Cr composites

за авторством Shaykevich, I.A., Kolesnyk, P.V.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2000)

Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique

за авторством Rozouvan, T.S., Poperenko, L.V., Shaykevich, I.A.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2015)

Angular dependences of ellipsometric parameters of thin Cr and Ti films under surface polariton excitation

за авторством Shybiko, Ya.A., Shaykevich, I.A., Melnichenko, L.Yu.
Опубліковано в: Functional Materials (2006)

Ellipsometric investigation of β-Si₃N₄ ceramics with Mo and Al additives

за авторством Prokopets', V.M., Shaykevich, I.A., Robur, L.Y.
Опубліковано в: Functional Materials (2005)

Optical properties of graphene film growing on a thin copper layer

за авторством Rozouvan, T.S., Poperenko, L.V., Kravets, V.G., Shaykevich, I.A.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2016)

Influence of surface dimensional effects and interband transitions on absorption of light in aluminium

за авторством Mеlnichenko, L.Yu., Tytarchuk, B.B., Shaykevich, I.A.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2002)

Determination of refractive index dispersion and thickness of thin antireflection films TiO₂ and Si₃N₄ on surfaces of silicon photoelectric converters

за авторством Donets, V.V., Melnichenko, L.Y., Shaykevich, I.A., Lomakina, O.V.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2009)

Optical properties of thin films of titanium with transient layers on them

за авторством Lendel, V.V., Lomakina, O.V., Mel’nychenko, L.Yu., Shaykevich, I.A.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2010)