Two-channel gettering of recombination-active impurity in polycrystalline solar silicon von V. H. Lytovchenko, V. M. Nasieka, A. A. Yevtukh

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Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer von A. V. Sachenko, V. P. Kostylov, V. H. Lytovchenko, V. H. Popov, B. M. Romaniuk, V. V. Chernenko, V. M. Nasieka, T. V. Slusar, S. I. Kyrylova, F. F. Komarov

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Creation of Specialized Manipulators for Low Tem pe rature Research von I. P. Zharkov, V. V. Safronov, V. O. Khodunov, V. M. Konoval, V. O. Maslov, O. V. Selivanov, A. H. Solonetskyi, V. V. Strelchuk, A. S. Nikolenko, B. I. Tsykaniuk, V. M. Nasieka

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Expansion of Bruker Vertex 70v FTIR Spectrometer Capabilities von I. P. Zharkov, V. V. Safronov, V. O. Khodunov, V. M. Konoval, V. O. Maslov, O. V. Selivanov, A. H. Solonetskyi, V. V. Strelchuk, A. S. Nikolenko, B. I. Tsykaniuk, V. M. Nasieka

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Research of recombination characteristics of Cz-Si implanted with iron ions von D. V. Hamov, O. I. Hudymenko, V. P. Kladko, V. H. Lytovchenko, V. P. Melnyk, O. S. Oberemok, V. H. Popov, Yu. O. Polishchuk, B. M. Romaniuk, V. V. Chernenko, V. M. Nasieka

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