Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy von S. S. Ponomaryov, V. O. Yukhymchuk, Ya. Valakh

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Founder and head of the scientific school of optics and spectroscopy (to the 100th anniversary of Academician M.P. Lysytsia) von Ye. Bieliaiev, Ya. Valakh, V. O. Yukhymchuk

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Simple method for SiC nanowires fabrication von V. S. Kiselov, O. S. Lytvyn, V. O. Yukhymchuk, A. E. Belyaev

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Theoretical and experimental study of Raman scattering in mixed (MoS2)x(MoSe2)1-x layered crystals von A. M. Yaremko, V. O. Yukhymchuk, Yu. A. Romanyuk, S. V. Virko

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Raman scattering in superlattices with Ge quantum dots von Yu. A. Romanyuk, A. M. Yaremko, V. M. Dzhagan, V. O. Yukhymchuk

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Raman scattering in superlattices with Ge quantum dots von Yu. A. Romaniuk, A. M. Yaremko, V. M. Dzhahan, V. O. Yukhymchuk

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Effect of thermal annealing on electrical and photoelectrical properties of n-InSb von S. V. Stariy, A. V. Sukach, V. V. Tetyorkin, V. O. Yukhymchuk, T. R. Stara

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Structural properties of nanocomposite SiO2(Si) films obtained by ion-plasma sputtering and thermal annealing von O. L. Bratus, A. A. Evtukh, O. S. Lytvyn, M. V. Voitovych, V. O. Yukhymchuk

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Efficient core-SiO2/shell-Au nanostructures for surface enhanced Raman scattering von V. O. Yukhymchuk, O. M. Hreshchuk, Ya. Valakh, M. A. Skoryk, V. S. Efanov, N. A. Matveevskaya

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Photolithography on photostimulated reversible and transient structural changes in CHG von V. A. Danko, I. Z. Indutnyi, M. V. Lukaniuk, V. I. Mynko, S. S. Ponomarov, Ye. Shepeliavyi, V. O. Yukhymchuk

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Microstructure of thin Si−Sn composite films von V. B. Neimash, V. M. Poroshyn, O. M. Kabaldin, V. O. Yukhymchuk, Ye. Shepeliavyi, V. A. Makara, Yu. Larkin

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Development and characterization of ceramic inserts Used in metallic resonators of EPR spectrometers to increase their sensitivity von S. V. Lemishko, I. P. Vorona, I. S. Golovina, V. O. Yukhymchuk, S. M. Okulov, V. V. Nosenko, S. O. Solopan, A. G. Belous

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Development and characterization of ceramic inserts Used in metallic resonators of EPR spectrometers to increase their sensitivity von S. V. Lemishko, I. P. Vorona, I. S. Holovina, V. O. Yukhymchuk, S. M. Okulov, V. V. Nosenko, S. O. Solopan, A. H. Bilous

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Tellurium effect on degradation stability of semiinsulating gallium arsenide crystals von N. I. Klyui, A. I. Liptuga, V. B. Lozinskii, A. P. Oksanich, S. E. Pritchin, F. V. Fomovskii, V. O. Yukhymchuk

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Tellurium effect on degradation stability of semiinsulating gallium arsenide crystals von M. I. Kliui, A. I. Liptuha, V. B. Lozinskyi, A. P. Oksanych, S. E. Prytchyn, F. V. Fomovskyi, V. O. Yukhymchuk

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Mechanism of tin-induced crystallization in amorphous silicon von V. B. Neimash, O. O. Hushcha, Ye. Shepeliavyi, V. O. Yukhymchuk, V. A. Danko, V. V. Melnyk, A. H. Kuzmych

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Tin doping effect on crystallization of amorphous silicon, obtained by vapor deposition in vacuum von V. B. Neimash, V. M. Poroshin, Ye. Shepeliavyi, V. O. Yukhymchuk, V. V. Melnyk, V. A. Makara, A. G. Kuzmich

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Microstructure of thin Si−Sn composite films von V. B. Neimash, V. M. Poroshin, A. M. Kabaldin, V. O. Yukhymchuk, P. E. Shepelyavyi, V. A. Makara, Yu. Larkin

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Design and characterization of nanostructured SERS substrates based on gold nanostars von V. O. Yukhymchuk, O. M. Hreshchuk, Ya. Valakh, Ye. G. Gule, M. A. Skoryk, V. S. Efanov, N. A. Matveevskaya, T. G. Beynik

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Mechanism of tin-induced crystallization in amorphous silicon von V. B. Neimash, A. O. Goushcha, P. E. Shepeliavyi, V. O. Yukhymchuk, V. A. Danko, V. V. Melnyk, A. G. Kuzmich

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