Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy by S. S. Ponomaryov, V. O. Yukhymchuk, Ya. Valakh

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Founder and head of the scientific school of optics and spectroscopy (to the 100th anniversary of Academician M.P. Lysytsia) by Ye. Bieliaiev, Ya. Valakh, V. O. Yukhymchuk

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Simple method for SiC nanowires fabrication by V. S. Kiselov, O. S. Lytvyn, V. O. Yukhymchuk, A. E. Belyaev

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Theoretical and experimental study of Raman scattering in mixed (MoS2)x(MoSe2)1-x layered crystals by A. M. Yaremko, V. O. Yukhymchuk, Yu. A. Romanyuk, S. V. Virko

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Raman scattering in superlattices with Ge quantum dots by Yu. A. Romanyuk, A. M. Yaremko, V. M. Dzhagan, V. O. Yukhymchuk

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Raman scattering in superlattices with Ge quantum dots by Yu. A. Romaniuk, A. M. Yaremko, V. M. Dzhahan, V. O. Yukhymchuk

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Effect of thermal annealing on electrical and photoelectrical properties of n-InSb by S. V. Stariy, A. V. Sukach, V. V. Tetyorkin, V. O. Yukhymchuk, T. R. Stara

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Structural properties of nanocomposite SiO2(Si) films obtained by ion-plasma sputtering and thermal annealing by O. L. Bratus, A. A. Evtukh, O. S. Lytvyn, M. V. Voitovych, V. O. Yukhymchuk

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Efficient core-SiO2/shell-Au nanostructures for surface enhanced Raman scattering by V. O. Yukhymchuk, O. M. Hreshchuk, Ya. Valakh, M. A. Skoryk, V. S. Efanov, N. A. Matveevskaya

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Photolithography on photostimulated reversible and transient structural changes in CHG by V. A. Danko, I. Z. Indutnyi, M. V. Lukaniuk, V. I. Mynko, S. S. Ponomarov, Ye. Shepeliavyi, V. O. Yukhymchuk

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Microstructure of thin Si−Sn composite films by V. B. Neimash, V. M. Poroshyn, O. M. Kabaldin, V. O. Yukhymchuk, Ye. Shepeliavyi, V. A. Makara, Yu. Larkin

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Development and characterization of ceramic inserts Used in metallic resonators of EPR spectrometers to increase their sensitivity by S. V. Lemishko, I. P. Vorona, I. S. Golovina, V. O. Yukhymchuk, S. M. Okulov, V. V. Nosenko, S. O. Solopan, A. G. Belous

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Development and characterization of ceramic inserts Used in metallic resonators of EPR spectrometers to increase their sensitivity by S. V. Lemishko, I. P. Vorona, I. S. Holovina, V. O. Yukhymchuk, S. M. Okulov, V. V. Nosenko, S. O. Solopan, A. H. Bilous

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Tellurium effect on degradation stability of semiinsulating gallium arsenide crystals by N. I. Klyui, A. I. Liptuga, V. B. Lozinskii, A. P. Oksanich, S. E. Pritchin, F. V. Fomovskii, V. O. Yukhymchuk

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Tellurium effect on degradation stability of semiinsulating gallium arsenide crystals by M. I. Kliui, A. I. Liptuha, V. B. Lozinskyi, A. P. Oksanych, S. E. Prytchyn, F. V. Fomovskyi, V. O. Yukhymchuk

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Mechanism of tin-induced crystallization in amorphous silicon by V. B. Neimash, O. O. Hushcha, Ye. Shepeliavyi, V. O. Yukhymchuk, V. A. Danko, V. V. Melnyk, A. H. Kuzmych

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Tin doping effect on crystallization of amorphous silicon, obtained by vapor deposition in vacuum by V. B. Neimash, V. M. Poroshin, Ye. Shepeliavyi, V. O. Yukhymchuk, V. V. Melnyk, V. A. Makara, A. G. Kuzmich

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Microstructure of thin Si−Sn composite films by V. B. Neimash, V. M. Poroshin, A. M. Kabaldin, V. O. Yukhymchuk, P. E. Shepelyavyi, V. A. Makara, Yu. Larkin

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Design and characterization of nanostructured SERS substrates based on gold nanostars by V. O. Yukhymchuk, O. M. Hreshchuk, Ya. Valakh, Ye. G. Gule, M. A. Skoryk, V. S. Efanov, N. A. Matveevskaya, T. G. Beynik

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Mechanism of tin-induced crystallization in amorphous silicon by V. B. Neimash, A. O. Goushcha, P. E. Shepeliavyi, V. O. Yukhymchuk, V. A. Danko, V. V. Melnyk, A. G. Kuzmich

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