Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy

за авторством S. S. Ponomaryov, V. O. Yukhymchuk, Ya. Valakh
Опубліковано 2016

Founder and head of the scientific school of optics and spectroscopy (to the 100th anniversary of Academician M.P. Lysytsia)

за авторством Ye. Bieliaiev, Ya. Valakh, V. O. Yukhymchuk
Опубліковано 2021

Simple method for SiC nanowires fabrication

за авторством V. S. Kiselov, O. S. Lytvyn, V. O. Yukhymchuk, A. E. Belyaev
Опубліковано 2011

Theoretical and experimental study of Raman scattering in mixed (MoS2)x(MoSe2)1-x layered crystals

за авторством A. M. Yaremko, V. O. Yukhymchuk, Yu. A. Romanyuk, S. V. Virko
Опубліковано 2015

Raman scattering in superlattices with Ge quantum dots

за авторством Yu. A. Romanyuk, A. M. Yaremko, V. M. Dzhagan, V. O. Yukhymchuk
Опубліковано 2015

Raman scattering in superlattices with Ge quantum dots

за авторством Yu. A. Romaniuk, A. M. Yaremko, V. M. Dzhahan, V. O. Yukhymchuk
Опубліковано 2015

Effect of thermal annealing on electrical and photoelectrical properties of n-InSb

за авторством S. V. Stariy, A. V. Sukach, V. V. Tetyorkin, V. O. Yukhymchuk, T. R. Stara
Опубліковано 2017

Structural properties of nanocomposite SiO2(Si) films obtained by ion-plasma sputtering and thermal annealing

за авторством O. L. Bratus, A. A. Evtukh, O. S. Lytvyn, M. V. Voitovych, V. O. Yukhymchuk
Опубліковано 2011

Efficient core-SiO2/shell-Au nanostructures for surface enhanced Raman scattering

за авторством V. O. Yukhymchuk, O. M. Hreshchuk, Ya. Valakh, M. A. Skoryk, V. S. Efanov, N. A. Matveevskaya
Опубліковано 2014

Photolithography on photostimulated reversible and transient structural changes in CHG

за авторством V. A. Danko, I. Z. Indutnyi, M. V. Lukaniuk, V. I. Mynko, S. S. Ponomarov, Ye. Shepeliavyi, V. O. Yukhymchuk
Опубліковано 2015

Microstructure of thin Si−Sn composite films

за авторством V. B. Neimash, V. M. Poroshyn, O. M. Kabaldin, V. O. Yukhymchuk, Ye. Shepeliavyi, V. A. Makara, Yu. Larkin
Опубліковано 2013

Microstructure of thin Si−Sn composite films

за авторством V. B. Neimash, V. M. Poroshin, A. M. Kabaldin, V. O. Yukhymchuk, P. E. Shepelyavyi, V. A. Makara, Yu. Larkin
Опубліковано 2013

Development and characterization of ceramic inserts Used in metallic resonators of EPR spectrometers to increase their sensitivity

за авторством S. V. Lemishko, I. P. Vorona, I. S. Holovina, V. O. Yukhymchuk, S. M. Okulov, V. V. Nosenko, S. O. Solopan, A. H. Bilous
Опубліковано 2021

Development and characterization of ceramic inserts Used in metallic resonators of EPR spectrometers to increase their sensitivity

за авторством S. V. Lemishko, I. P. Vorona, I. S. Golovina, V. O. Yukhymchuk, S. M. Okulov, V. V. Nosenko, S. O. Solopan, A. G. Belous
Опубліковано 2021

Tellurium effect on degradation stability of semiinsulating gallium arsenide crystals

за авторством N. I. Klyui, A. I. Liptuga, V. B. Lozinskii, A. P. Oksanich, S. E. Pritchin, F. V. Fomovskii, V. O. Yukhymchuk
Опубліковано 2014

Tellurium effect on degradation stability of semiinsulating gallium arsenide crystals

за авторством M. I. Kliui, A. I. Liptuha, V. B. Lozinskyi, A. P. Oksanych, S. E. Prytchyn, F. V. Fomovskyi, V. O. Yukhymchuk
Опубліковано 2014

Mechanism of tin-induced crystallization in amorphous silicon

за авторством V. B. Neimash, O. O. Hushcha, Ye. Shepeliavyi, V. O. Yukhymchuk, V. A. Danko, V. V. Melnyk, A. H. Kuzmych
Опубліковано 2014

Tin doping effect on crystallization of amorphous silicon, obtained by vapor deposition in vacuum

за авторством V. B. Neimash, V. M. Poroshin, Ye. Shepeliavyi, V. O. Yukhymchuk, V. V. Melnyk, V. A. Makara, A. G. Kuzmich
Опубліковано 2013

Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin

за авторством R. M. Rudenko, V. V. Voitovych, M. M. Krasko, A. H. Kolosiuk, A. M. Kraichynskyi, V. O. Yukhymchuk, V. A. Makara
Опубліковано 2013

Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin

за авторством R. M. Rudenko, V. V. Voitovych, M. M. Krasko, A. G. Kolosyuk, A. M. Kraichynskyi, V. O. Yukhymchuk, V. A. Makara
Опубліковано 2013