Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy за авторством S. S. Ponomaryov, V. O. Yukhymchuk, Ya. Valakh

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Founder and head of the scientific school of optics and spectroscopy (to the 100th anniversary of Academician M.P. Lysytsia) за авторством Ye. Bieliaiev, Ya. Valakh, V. O. Yukhymchuk

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Simple method for SiC nanowires fabrication за авторством V. S. Kiselov, O. S. Lytvyn, V. O. Yukhymchuk, A. E. Belyaev

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Theoretical and experimental study of Raman scattering in mixed (MoS2)x(MoSe2)1-x layered crystals за авторством A. M. Yaremko, V. O. Yukhymchuk, Yu. A. Romanyuk, S. V. Virko

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Raman scattering in superlattices with Ge quantum dots за авторством Yu. A. Romanyuk, A. M. Yaremko, V. M. Dzhagan, V. O. Yukhymchuk

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Raman scattering in superlattices with Ge quantum dots за авторством Yu. A. Romaniuk, A. M. Yaremko, V. M. Dzhahan, V. O. Yukhymchuk

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Effect of thermal annealing on electrical and photoelectrical properties of n-InSb за авторством S. V. Stariy, A. V. Sukach, V. V. Tetyorkin, V. O. Yukhymchuk, T. R. Stara

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Structural properties of nanocomposite SiO2(Si) films obtained by ion-plasma sputtering and thermal annealing за авторством O. L. Bratus, A. A. Evtukh, O. S. Lytvyn, M. V. Voitovych, V. O. Yukhymchuk

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Efficient core-SiO2/shell-Au nanostructures for surface enhanced Raman scattering за авторством V. O. Yukhymchuk, O. M. Hreshchuk, Ya. Valakh, M. A. Skoryk, V. S. Efanov, N. A. Matveevskaya

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Photolithography on photostimulated reversible and transient structural changes in CHG за авторством V. A. Danko, I. Z. Indutnyi, M. V. Lukaniuk, V. I. Mynko, S. S. Ponomarov, Ye. Shepeliavyi, V. O. Yukhymchuk

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Microstructure of thin Si−Sn composite films за авторством V. B. Neimash, V. M. Poroshyn, O. M. Kabaldin, V. O. Yukhymchuk, Ye. Shepeliavyi, V. A. Makara, Yu. Larkin

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Development and characterization of ceramic inserts Used in metallic resonators of EPR spectrometers to increase their sensitivity за авторством S. V. Lemishko, I. P. Vorona, I. S. Golovina, V. O. Yukhymchuk, S. M. Okulov, V. V. Nosenko, S. O. Solopan, A. G. Belous

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Development and characterization of ceramic inserts Used in metallic resonators of EPR spectrometers to increase their sensitivity за авторством S. V. Lemishko, I. P. Vorona, I. S. Holovina, V. O. Yukhymchuk, S. M. Okulov, V. V. Nosenko, S. O. Solopan, A. H. Bilous

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Tellurium effect on degradation stability of semiinsulating gallium arsenide crystals за авторством N. I. Klyui, A. I. Liptuga, V. B. Lozinskii, A. P. Oksanich, S. E. Pritchin, F. V. Fomovskii, V. O. Yukhymchuk

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Tellurium effect on degradation stability of semiinsulating gallium arsenide crystals за авторством M. I. Kliui, A. I. Liptuha, V. B. Lozinskyi, A. P. Oksanych, S. E. Prytchyn, F. V. Fomovskyi, V. O. Yukhymchuk

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Mechanism of tin-induced crystallization in amorphous silicon за авторством V. B. Neimash, O. O. Hushcha, Ye. Shepeliavyi, V. O. Yukhymchuk, V. A. Danko, V. V. Melnyk, A. H. Kuzmych

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Tin doping effect on crystallization of amorphous silicon, obtained by vapor deposition in vacuum за авторством V. B. Neimash, V. M. Poroshin, Ye. Shepeliavyi, V. O. Yukhymchuk, V. V. Melnyk, V. A. Makara, A. G. Kuzmich

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Microstructure of thin Si−Sn composite films за авторством V. B. Neimash, V. M. Poroshin, A. M. Kabaldin, V. O. Yukhymchuk, P. E. Shepelyavyi, V. A. Makara, Yu. Larkin

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Design and characterization of nanostructured SERS substrates based on gold nanostars за авторством V. O. Yukhymchuk, O. M. Hreshchuk, Ya. Valakh, Ye. G. Gule, M. A. Skoryk, V. S. Efanov, N. A. Matveevskaya, T. G. Beynik

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Mechanism of tin-induced crystallization in amorphous silicon за авторством V. B. Neimash, A. O. Goushcha, P. E. Shepeliavyi, V. O. Yukhymchuk, V. A. Danko, V. V. Melnyk, A. G. Kuzmich

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