Formation of rectifying contact in semiconductor–vacuum–metal system by L. G. Ilchenko, V. V. Ilchenko, V. V. Lobanov

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Impact of atomic structure of metal surface on potential relief of closely located surface of semiconductor by L. G. Ilchenko, V. V. Ilchenko, V. V. Lobanov

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Efect of metal on the surface characteristics of semiconductor by L. H. Ilchenko, V. V. Ilchenko, V. V. Lobanov

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Algorithms for Separating the Sum of Vibrations and Identifying their Sources by V .A. Zelinsky, S. V. Lusochenko, V.V. Ilchenko, Yu. L. Sheredeko

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Effect of Gas environment on electrophysical parameters of heterojunctions on the basis of schottky barrier with nano-structured (95% In2O3 + 5% SnO2) oxide films by V. V. Ilchenko, O. M. Kostiukevych, V. V. Lendiel, V. I. Radko, N. S. Holoborodko

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Effect of Gas environment on electrophysical parameters of heterojunctions on the basis of schottky barrier with nano-structured (95% In2O3 + 5% SnO2) Oxide films by V. V. Ilchenko, O. M. Kostiukevych, V. V. Lendiel, V. I. Radko, N. S. Goloborodko

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Determination of Vibration Object' Coordinate on Surface of Earth by V. A. Zelinsky, S. V. Lysochenko, V. V. Ilchenko, M. M. Nikiforov, O. L. Kulsky, V. V. Krichta

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Electrical properties of MIS structures with silicon nanoclusters by S. V. Bunak, V. V. Ilchenko, V. P. Melnik, I. M. Hatsevych, B. N. Romanyuk, A. G. Shkavro, O. V. Tretyak

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Electrical properties of semiconductor structures with Si nanoclusters in SiO2 grown by high temperature annealing technology of SiOX layer, X<2 by S. V. Bunak, A. A. Buyanin, V. V. Ilchenko, V. V. Marin, V. P. Melnik, I. M. Khacevich, O. V. Tretyak, A. G. Shkavro

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