Search Results - Venger, E.F.
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Peculiarities of injection phenomena in heavily doped silicon structures and development of radiation-resistant diode temperature sensors by Shwarts, Yu.M., Sokolov, V.N., Shwarts, M.M., Venger, E.F.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)Get full text
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Analysis of the fundamental absorption edge of the films obtained from the C₆₀ fullerene molecular beam in vacuum and effect of internal mechanical stresses on it by Kolyadina, E.Yu., Matveeva, L.A., Neluba, P.L., Venger, E.F.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2015)Get full text
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