Харвестер відкритої науки НАН України

X-ray diffraction study of deformation state in InGaN/GaN multilayered structures

von Kladko, V.P., Kuchuk, A.V., Safryuk, N.V., Machulin, V.F., Belyaev, A.E., Konakova, R.V., Yavich, B.S.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2010)

Formation of ohmic contacts to n(p)-gan and measurement of their contact resistivity

von Boltovets, M.S., Ivanov, V.M., Konakova, R.V., Kudryk, Ya.Ya., Milenin, V.V., Shynkarenko, V.V., Sheremet, V.M., Sveshnikov, Yu.N., Yavich, B.S.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2010)

Deformation state of short-period AlGaN/GaN superlattices at different well-barrier thickness ratios

von Kladko, V.P., Safriuk, N.V., Stanchu, H.V., Kuchuk, A.V., Melnyk, V.P., Oberemok, A.S., Kriviy, S.B., Maksymenko, Z.V., Belyaev, A.E., Yavich, B.S.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2014)