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Dispersion (Phase) Nature of Structural Sensitivity and Informativity of Triple-Crystal Diffractometry of Defects and Strains within the Ion-Implanted Films von O. S. Skakunova, S. Y. Olikhovskyi, V. B. Molodkin, Ye. H. Len, Ye. M. Kyslovskyi, O. V. Reshetnyk, T. P. Vladimirova, Ye. V. Kochelab, V. V. Lizunov, S. V. Lizunova, V. L. Makivska, M. H. Tolmachov, L. M. Skapa, Ya. V. Vasylyk, K. V. Fuzik

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