Search Results - Ye. H. Len
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Dispersion (Phase) Nature of Structural Sensitivity and Informativity of Triple-Crystal Diffractometry of Defects and Strains within the Ion-Implanted Films by O. S. Skakunova, S. Y. Olikhovskyi, V. B. Molodkin, Ye. H. Len, Ye. M. Kyslovskyi, O. V. Reshetnyk, T. P. Vladimirova, Ye. V. Kochelab, V. V. Lizunov, S. V. Lizunova, V. L. Makivska, M. H. Tolmachov, L. M. Skapa, Ya. V. Vasylyk, K. V. Fuzik
Published 2015Get full text
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