TEM and SAED study of island-like CoFe thin films
The impact of component concentration on the crystal structure and microstructure of island-like CoFe thin films was studied by the Selected Area Electron Diffraction (SAED) technique and Transmission Electron Microscopy (TEM)
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| Date: | 2026 |
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| Main Authors: | , , |
| Format: | Data |
| Published: |
DataverseUA
2026
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| Subjects: | |
| Online Access: | https://doi.org/10.48788/DVUA/B2WHCU |
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| Journal Title: | Open Data Repository of the National Academy of Sciences of Ukraine |
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