Structural and morphological properties of annealed films of the As2S3-Sb2S3-SbI3 system
The results of investigations of the structure and surface morphology of annealed (As2S3)x(Sb2S3)y(SbI3)z (x = 45, 40, 35 і 30; у =27.5, 30, 32.5 і 35; z = 27.5,30,32.5 і 35) films are presents. Amorphous (As2S3)x(Sb2S3)y(SbI3)z films with a thickness ~ 500 nm were obtained by vacuum evapo...
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| Date: | 2023 |
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| Main Authors: | , , , , , , , , |
| Format: | Article |
| Language: | Ukrainian |
| Published: |
Інститут проблем реєстрації інформації НАН України
2023
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| Subjects: | |
| Online Access: | http://drsp.ipri.kiev.ua/article/view/300334 |
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| Journal Title: | Data Recording, Storage & Processing |
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Data Recording, Storage & Processing| Summary: | The results of investigations of the structure and surface morphology of annealed (As2S3)x(Sb2S3)y(SbI3)z (x = 45, 40, 35 і 30; у =27.5, 30, 32.5 і 35; z = 27.5,30,32.5 і 35) films are presents. Amorphous (As2S3)x(Sb2S3)y(SbI3)z films with a thickness ~ 500 nm were obtained by vacuum evaporation of glasses corresponding compositions from quasi-closed effusion cells on to unheated glass substrates. The films were annealed at a temperature of 398 K for 1 hour. The structure of the annealed films was studied by the Raman spectroscopy method. For the investigations of the surface morphology of films a field emission scanning electron microscopy (FESEM) analysis was performed.
Based on the analysis of the positions and intensities of the main vibrational bands of the Raman spectra and SEM-images of the surfaces of the annealed films of the As2S3-Sb2S3-SbI3 system, it was established that their matrix mainly contains crystalline SbI3 inclusions that have a layered (two-dimensional) structure. Other weak features in the spectra of annealed films are related to the presence of As(Sb)S3, As4S4, As4S3, Sn, and S8 structural fragments in the matrix. Fig.: 4. Refs: 25 titles. |
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