Structural and morphological properties of annealed films of the As2S3-Sb2S3-SbI3 system

• Date: 2023
• Main Authors: Грещук, О. М., Дуркот, М. О., Л. І. Макар, Л. І., Мудрий, С. І., Рубіш, В. М., Трикур, І. І., Штаблавий, І. І., Юркін, І. М., Юхимчук, В. О.
• Format: Article
• Language: Ukrainian
• Published: Інститут проблем реєстрації інформації НАН України 2023
• Subjects: chalcogenide films; Raman spectroscopy; scanning electron microscopy; structure; surface morphology
• Online Access: http://drsp.ipri.kiev.ua/article/view/300334
• Journal Title: Data Recording, Storage & Processing

The results of investigations of the structure and surface morphology of annealed (As2S3)x(Sb2S3)y(SbI3)z  (x = 45, 40, 35 і 30; у =27.5, 30, 32.5 і 35; z = 27.5,30,32.5 і 35) films are presents. Amorphous (As2S3)x(Sb2S3)y(SbI3)z films with a thickness ~ 500 nm were obtained by vacuum evapo...