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Development of a method of absorbed dose on-line monitoring at product processing by scanned electron beam
The conditions of the contact-free absorbed dose monitoring at industrial product processing by electron beam are investigated. The method is based on analysing the collected charge in a stack monitor (SМ) mounted downstream of irradiated object. Using computer simulation on the basis of a modifie...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2016
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| Series: | Вопросы атомной науки и техники |
| Subjects: | |
| Online Access: | http://dspace.nbuv.gov.ua/handle/123456789/115370 |
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