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The temperature dependence of the inelastic scattering time in InGaN grown by MOVPE

Low temperature electrical measurements of the resistivity, the Hall effect and the magnetoconductivity were performed on an InGaN sample having an electron concentration far above the critical value for the metalinsulator transition. Weak localization effect and two-band model were used to analyze...

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Bibliographic Details
Main Authors: Yildiz, A., Kasap, M.
Format: Article
Language:English
Published: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2010
Series:Физика низких температур
Subjects:
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/117016
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